Design Considerations for Maximizing Throughput and Accuracy in Switch/Measure Instrumentation
Jerry Janesch is a Marketing Manager at Keithley Instruments, Inc., headquartered in Cleveland, Ohio. He earned a Bachelor degree in Electrical Engineering from Fenn College of Engineering and a Master of Business Administration from John Carroll University. He has been with Keithley for ten years.
This seminar offers insights into the speed vs. accuracy trade-offs involved in making multi-channel measurements with a digital multimeter (DMM) and relay switching. We’ll explore the various interactions between these instruments, such as signal errors caused by switching hardware, improper instrument coordination, measurement compensation techniques, and automated scanning.
Participant Objectives: By participating in this seminar, you will learn and understand:
- Practical considerations for selecting the right type of DMM and switching hardware
- Sources of measurement errors
- Impact of relay settling time on measurement performance
- Typical configuration, measurement, and optimization techniques