Design Considerations for Maximizing Throughput and Accuracy in Switch/Measure Instrumentation
This seminar offers insights into the speed vs. accuracy trade-offs involved in making multi-channel measurements with a digital multimeter (DMM) and relay switching. We’ll explore the various interactions between these instruments, such as signal errors caused by switching hardware, improper instrument coordination, measurement compensation techniques, and automated scanning.
Participant Objectives: By participating in this seminar, you will learn and understand:
The Webcast can be viewed on-demand now by clicking here.
